From cast10-request@bevo.che.wisc.edu Mon Jul 31 09:58:01 2000 Resent-Date: Mon, 31 Jul 2000 09:58:01 -0500 (CDT) MIME-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Transfer-Encoding: 7bit Message-ID: <14725.37880.16871.974092@bahaha.che.wisc.edu> Date: Mon, 31 Jul 2000 09:58:00 -0500 (CDT) From: "James B. Rawlings" To: cast10@bevo.che.wisc.edu Subject: CAST: CPC 6 REGISTRATION (Third) Announcement X-CAST-Category: meetings 2001-01 Resent-Message-ID: <"n9e4GS3j6XP.A.urH.4PZh5"@bevo.che.wisc.edu> Resent-From: cast10@bevo.che.wisc.edu X-Mailing-List: X-Loop: cast10@bevo.che.wisc.edu Precedence: list Resent-Sender: cast10-request@bevo.che.wisc.edu Sender: cast10-request@bevo.che.wisc.edu Errors-To: cast10-request@bevo.che.wisc.edu ----------------------------------------------------------------- NOTE: Past postings on the CAST10 Email List are archived on the World Wide Web at http://www.che.wisc.edu/cast10 ----------------------------------------------------------------- The Tradition Continues.... Chemical Process Control 6 *** R E G I S T R A T I O N (Third) announcement *** What: Chemical Process Control (CPC) 6 http://www.che.wisc.edu/cpc-6/ When: January 7-12, 2001 Where: Westward Look Resort, Tucson, Arizona Registration: CACHE Website is open for business http://www.che.utexas.edu/cache/cpc/ Fees: $675 (until 2 October) $800 (2 October -- 15 December) Sessions: The following is the current sessions list. Some speakers and titles may change before the conference. The latest program is always available on the conference website. Session Topic (Organizer) * Opening Session (J. Brian Froisy) Author: Lowell B. Koppel, Value Techniques LLC Title: Business Process Control: The Outer Loop Author: J. Patrick Kennedy, OSI Software Title: Influence of Computers and Information Technology on Process Operations and Business Processes - A Case Study * Modelling and Identification (Jay H. Lee) Author: Wolfgang Marquardt, RWTH Aachen Title: Modeling for Control -or- Model Reduction for Control Discussant: Thomas A. Badgwell, Aspentech Author: Ton Backx, IPCOS Technology Title: System Identification: State of the Art and Current Needs - Industrial Perspective Discussant:Daniel Rivera, Arizona State University Author: Sten Bay Jorgensen (speaker), Technical Univ. Denmark, Jay H. Lee, Georgia Institute of Technology Title: Recent Advances and Challenges in Process Identification - Academic Perspective Needs - Academic Perspective Discussant:John F. MacGregor, McMaster University Panel Discussion: Fundamental modeling vs. system identification (What are the merits and demerits? What's the role of large, nonlinear fundamental models in control? How can the two be merged? Panelists: Three speakers. Moderated by the organizer. * Life Sciences (Francis J. Doyle) Author: Adam Arkin, Univ. California, Lawrence Berkeley National Laboratory Title: Stochastic and Deterministic Control in Two Bacterial Cellular Networks Discussant: James Schwaber, Thomas Jefferson University Authors:Sangtae Kim, Warner Lambert Eli Mintz, Compugen, Inc. Title: Bioinformatics and the B2B Paradigm Discussant:Prof. Dr.-Ing. Matthias Reuss, University of Stuttgart * Control Theory (Frank Allgower) Author: Dimitri Bertsekas, MIT Title: Neuro-Dynamic Programming: A Survey Author: Jan Willems, University of Groningen Title: The Behavioral Approach to Modelling and Control of Dynamical Systems * Hybrid Systems (Manfred Morari) Author: Stefan Kowalewski, Bosch Title: Hybrid Systems in Process Control: Challenges, Methods, and Limits Author: Manfred Morari, ETH Title: Hybrid System Analysis and Control via Mixed Integer Optimization Author: Ignacio Grossmann, CMU Title: Discrete Optimization Methods and their Role in the Integration of Planning,Scheduling and Control * Controller Performance Monitoring and Maintenance (Derrick J. Kozub) Authors:Randy Miller, Lane Desborough, Honeywell Hi-Spec Solutions Title: Increasing Customer Value of Industrial Control Performance Monitoring -- Honeywell's Experience Author: Thomas J. Harris, Queen's University Chris T. Seppala, Equilon Enterprises LLC Title: Diagnosis and Analysis of Control Systems Author: Sirish Shah, University of Alberta Title: Control Loop Performance Assessment: Industrial Applications and New Challenges Panel Discussion: Authors Moderator: John F. MacGregor, McMaster University * Chemical Reactors/Separators (Lorenz T. Biegler, B. Wayne Bequette) Author: Efstratios N. Pistikopoulos, Imperial College Title: Simultaneous Design & Control Optimization under Uncertainty in Reaction/Separation Systems Authors:Karsten-Ulrich Klatt (speaker), Guido Duennebier, Felix Hanisch and Sebastian Engell, Univ. Dortmund Title: Optimal Operation and Control of Simulated Moving Bed Chromatography: a Model-based Approach Authors:D. Bonvin (speaker) and B. Srinivasan, EPFL D. Ruppen, Lonzagroup Title: Optimization Issues in the Batch Chemical Industry * Modeling and Control of Complex Products (Babatunde A. Ogunnaike) Authors:Prodromos Daoutidis, U. Minnesota Michael Henson, LSU Title: Dynamics and Control of Cell Populations Authors:Francis J. Doyle, U. Delaware Cajetan Cordero, Air Products Masoud Soroush, Drexel University Title: Control of Product Quality in Polymerization Processes Authors:Richard Braatz, U. Illinois Shinji Hasebe, Kyoto University Title: Particle size and shape control in crystallization processes * Closing Session (James B. Rawlings) Author: James J. Downs, Eastman Chemical Company Title: Linking Control Strategy Design and Model Predictive Control Author: Robert E. Young, ExxonMobil Chemical Title: Evolution of an Industrial Nonlinear Model Predictive Controller Authors:Rudolf Kulhavy, Joseph Lu, Tariq Samad, Honeywell Title: Emerging Technologies for Enterprise Optimization for the Process Industries * Poster Session (Kenneth R. Muske) * Vendor and Software Display (S. Joe Qin) Intended Audience: The CPC conference is an international conference attracting participants from North and South America, Europe and the Pacific Rim. We would greatly appreciate your forwarding this announcement to interested colleagues. We are seeking wide distribution among people with process systems backgrounds and interests. It is particularly important to reach interested industrial practitioners and people outside the U.S. and North America, who are not well represented on the cast email list. Format: In the tradition of CPC conferences, speakers will be selected and all oral presentations will be invited. A poster session will be available for submitted contributions. Number of Participants: 100-150 attendees expected (approximately 130 people attended CPC 5). Goals: The goals of the CPC conference series are to: 1. Gain an appreciation of the state of process control practice in industries currently or potentially employing and supported by process control engineers and chemical engineers with systems backgrounds. 2. Present tutorial overviews for nonspecialists in each of the important areas of systems and control theory, particularly emerging and new areas. 3. Provide a forum for in-depth discussions between university researchers, industrial practitioners and commercial control technology vendors. 4. Provide practitioners and vendors with a current understanding of the new and significant tools emerging from the research community in order to stimulate wider implementation. 5.Provide a forum for assessing promising research directions for the next decade. Assess needs and challenges in the process industries, as well as evaluate opportunities for increased activity and application in non-traditional industries. Co-Chairs James B. Rawlings Department of Chemical Engineering University of Wisconsin Madison, Wisconsin Babatunde A. Ogunnaike DuPont Company Wilmington, Delaware Organizing Committee Frank Allgower Derrick Kozub B. Wayne Bequette Jay H. Lee Lorenz T. Biegler Jorge Mandler Francis J. Doyle Wolfgang Marquardt James J. Downs Thomas J. McAvoy Thomas F. Edgar Manfred Morari J. Brian Froisy Kenneth R. Muske Christos Georgakis Ahmet N. Palazoglu Vince Grassi Stephen Piche Iori Hashimoto Sigurd Skogestad Rob Hawkins Robert E. Young